SCAN926260TUF/NOPB

Overview

The SCAN926260TUF/NOPB is an LVDS interface integrated circuit manufactured by Texas Instruments, functioning as a set of six 1-to-10 bus LVDS deserializers. It supports data rates up to 660 Mb/s with a supply voltage range of 3 V to 3.6 V and operates within a temperature range of -40°C to +85°C. The device features LVTTL input types and utilizes an LBGA-196 package for surface mount installation. It integrates IEEE 1149.1 boundary scan capabilities and at-speed built-in self-test (BIST) functionality for comprehensive system verification.

Feature Summary

• Integrates six independent 1-to-10 bus LVDS deserializers for high-density signal distribution
• Supports IEEE 1149.1 standard for boundary scan testing and system-level diagnostics
• Includes at-speed built-in self-test (BIST) capability for verifying serial link integrity during operation

Applications

• High-speed digital signal processing systems requiring parallel-to-serial conversion reversal
• Test and measurement equipment utilizing boundary scan architecture for fault isolation
• Industrial control systems needing reliable LVDS deserialization in noisy environments

Procurement Notes

Verify the manufacturer designation carefully, as National Semiconductor was acquired by Texas Instruments. Ensure the specific suffix matches the required package and environmental specifications. Confirm RoHS compliance status through official documentation before procurement. Check for obsolescence notices or recommended replacement parts if sourcing from secondary markets.

Selection Notes

Select this component when designing systems that require multiple LVDS deserialization channels on a single chip. Consider the LBGA-196 package constraints for PCB layout and thermal management. Evaluate the power dissipation characteristics against the available cooling solutions. Ensure compatibility with the upstream serializer output standards and the downstream logic input requirements.

Part Context

This part belongs to the SCAN926260 series of LVDS interface ICs originally developed by National Semiconductor and continued under Texas Instruments. It is designed for applications demanding high channel density and robust testability. The device complements other serializers and muxes in the same family to form complete data transmission links.

Replacement Considerations

Consult official Texas Instruments documentation for direct pin-compatible replacements or upgraded versions. Verify functional equivalence regarding data rate and interface standards before substitution.