SCAN926260TUFX

Overview

The SCAN926260TUFX is an LVDS interface integrated circuit manufactured by National Semiconductor, now part of Texas Instruments. It functions as a set of six 1-to-10 bus LVDS deserializers. The device supports data rates up to 660 Mb/s and operates with LVTTL inputs converted to LVDS outputs. It features IEEE 1149.1 (JTAG) compliance and includes at-speed Built-In Self-Test (BIST) capabilities for high-speed signal verification. The component operates within a supply voltage range of 3 V to 3.6 V, typically 3.3 V, with a maximum power dissipation of 3.7 W. It is housed in a 196-pin LBGA package and is rated for industrial temperatures from -40°C to +85°C.

Feature Summary

• Integrates six independent 1-to-10 bus LVDS deserializers for parallel-to-serial conversion.
• Includes IEEE 1149.1 boundary scan architecture for system-level testing and debugging.
• Supports at-speed Built-In Self-Test (BIST) to verify high-speed serial link integrity during operation.

Applications

• High-speed digital signal processing systems requiring parallel-to-serial conversion.
• Telecommunications infrastructure utilizing LVDS interconnects.
• Industrial control systems needing robust boundary scan and self-test capabilities.

Procurement Notes

Verify the manufacturer status carefully, as National Semiconductor was acquired by Texas Instruments. Ensure the specific suffix TUFX/NOPB matches the required pinout and packaging specifications. Confirm RoHS compliance details through official datasheets, as legacy parts may have varying environmental certifications depending on the production batch and current TI inventory policies.

Selection Notes

Select this component when a design requires multiple low-voltage differential signaling deserialization channels within a single package. It is suitable for applications demanding JTAG accessibility and functional testing of high-speed buses without external test equipment. Compare against similar SCAN92 series devices if different channel counts or serializer/deserializer combinations are needed.

Part Context

This part belongs to the SCAN92 series of high-speed interface ICs originally developed by National Semiconductor. The series is designed for complex digital systems requiring reliable LVDS communication. Following the acquisition by Texas Instruments, these components are managed under TI's portfolio, often retaining the original designation while updating manufacturing processes and documentation standards.

Replacement Considerations

Direct replacements include the SCAN926260TUFX/NOPB variant from Texas Instruments, which maintains functional compatibility. Other members of the SCAN92 family, such as the SCAN921260, may serve as alternatives if channel configurations differ. Verify pin compatibility and electrical characteristics before substituting any related deserializer ICs.

FAQ

What is the primary function of the SCAN926260TUFX?

It provides six independent 1-to-10 bus LVDS deserializers, converting parallel LVTTL inputs into serial LVDS outputs.

Does this component support boundary scan testing?

Yes, it integrates IEEE 1149.1 (JTAG) boundary scan logic for system-level testing and debugging.

What is the maximum operating temperature?

The device is rated for an industrial temperature range, with a maximum operating temperature of +85°C.