SCAN928028TUF

Overview

The SCAN928028TUF is an eight-channel serializer manufactured by Texas Instruments, designed to serialize up to eight 10-bit data streams into a single output channel. It operates with a parallel clock rate ranging from 18 to 66 MHz, supporting a maximum data rate of 660 Mb/s. The device accepts LVCMOS or LVTTL inputs and provides LVDS or BLVDS outputs. It functions within a supply voltage range of 3 V to 3.6 V and operates at temperatures between -40°C and +85°C. The component is housed in a 196-LBGA package.

Feature Summary

• Supports simultaneous serialization of eight 10-bit data channels into one serial output
• Complies with IEEE 1149.1 standards and includes at-speed BIST test mode
• Maintains synchronous operation across all channels relative to the parallel clock rate

Applications

• High-speed data transmission systems requiring multi-channel serialization
• Industrial equipment interfaces utilizing LVDS signaling
• Test and measurement devices requiring built-in self-test capabilities

Procurement Notes

Verify the specific suffix (TUF) against the manufacturer's current product status documentation to confirm availability and lead times. Ensure that the LBGA-196 package dimensions match the target PCB footprint requirements. Confirm that the operating temperature range meets the environmental specifications of the intended application environment before finalizing procurement decisions.

Selection Notes

Select this component when an interface requires consolidating multiple parallel data lines into a single high-speed serial link. The choice is appropriate for designs needing IEEE 1149.1 compliance for testing purposes. Consider the power consumption and thermal dissipation characteristics inherent to the 196-LBGA package during the initial design phase to ensure adequate cooling solutions are implemented.

Part Context

This part belongs to the SCAN928028 series of serializers produced by Texas Instruments. It serves as a specialized interface solution for converting parallel digital signals into serial formats suitable for long-distance transmission. The device integrates test features directly into the silicon, distinguishing it from basic serializers that lack built-in diagnostic capabilities.

Replacement Considerations

Public confirmed substitute part numbers are not available in the provided documentation. Verify compatibility with existing board layouts if considering alternative manufacturers, as pinouts and electrical characteristics may differ significantly.