SCANPSC110FSC

Specialized Overview

The SCANPSC110FSC is a hierarchical and multidrop addressable JTAG port bridge designed for IEEE Std. 1149.1 system test support. Manufactured by onsemi (formerly Fairchild Semiconductor), it extends the standard test bus into multidrop environments, allowing up to 59 unique addresses plus broadcast and multi-cast groups. The device features three configurable local scan ports, a 32-bit TCK counter for built-in self-test operations, and a 16-bit LFSR signature compactor. It operates on a 5.0V power supply and utilizes a 28-lead Small Outline Integrated Circuit (SOIC) package.

Specialized Feature Summary

• Supports true IEEE 1149.1 hierarchical and multidrop addressing with six slot inputs for unique identification.
• Provides three independent local scan ports that can be individually or serially inserted into the active scan chain.
• Includes a 32-bit TCK counter to enable simultaneous built-in self-test operations across different scan chains.
• Features a 16-bit Linear Feedback Shift Register (LFSR) for compacting serial test data signatures.

Specialized Applications

• Hierarchical boundary-scan tree construction for complex system testing
• Backplane and inter-board testing in multidrop environments
• System test circuitry requiring improved throughput over single serial chains

Specialized Procurement Notes

Verify the specific ordering suffix 'SC' corresponds to the 28-lead SOIC package variant when sourcing replacements. Confirm that the component is sourced from authorized distributors to ensure authenticity, as this legacy part may have limited new production availability. Check for RoHS compliance status if required for current manufacturing standards.

Specialized Selection Notes

Select this component when a design requires extending JTAG connectivity across multiple boards without increasing trace complexity. Ensure the target system supports Level 1 and Level 2 protocol implementations. Verify that the available slot pins are sufficient for the required number of unique addresses in the multidrop network.

Specialized Part Context

This component belongs to the SCANPSC family of boundary scan controllers. It serves as a bridge between a parallel processor bus and a serial scan test bus, facilitating efficient testing of large-scale integrated systems. The device was originally developed by Fairchild Semiconductor before being acquired by onsemi.

Specialized Replacement Considerations

SCANPSC100F