SCANSTA101SMX-NS

Specialized Overview

The SCANSTA101SMX-NS is a low-voltage IEEE 1149.1 System Test Access (STA) Master controller manufactured by National Semiconductor, now part of Texas Instruments. It supports boundary scan protocols for system-level testing and debugging. The device operates within an industrial temperature range of -40°C to +85°C and utilizes an nFBGA-49 surface-mount package. It is designed for integration into complex electronic systems requiring standardized test access capabilities.

Specialized Feature Summary

• Supports IEEE 1149.1 boundary scan standard for system-level test access
• Low voltage operation suitable for modern integrated circuits
• Industrial temperature rating for reliable performance in varied environments

Specialized Applications

• System-level boundary scan testing infrastructure
• Debugging and verification of complex printed circuit boards
• Manufacturing test equipment for board-level diagnostics

Specialized Part Context

This component belongs to the SCANSTA101 family of specialized interface ICs. It serves as a master controller for JTAG-based testing, enabling communication with slave devices on a board. The suffix 'NS' indicates its origin from National Semiconductor prior to the company's acquisition by Texas Instruments.

Specialized FAQ

Is this component compatible with standard JTAG interfaces?

Yes, it is designed to support the IEEE 1149.1 standard, which defines the JTAG interface for system-level testing.

What is the operating temperature range?

The device is rated for an industrial temperature range from -40°C to +85°C.