SCANSTA111MT

Specialized Overview

The SCANSTA111MT is an enhanced SCAN bridge multidrop addressable IEEE 1149.1 (JTAG) port manufactured by Texas Instruments. It supports up to 121 unique addresses via seven slot inputs and provides three configurable local scan ports. The device operates on a 3.0V to 3.6V supply voltage with a maximum operating temperature of +85°C. It features a 32-bit TCK counter, a 16-bit LFSR signature compactor, and power-off high-impedance I/Os. The component is housed in an nFBGA-49 package and is designated as NRND (Not Recommended for New Designs).

Specialized Feature Summary

• Supports hierarchical and multidrop addressing for improved test throughput.
• Enables transparent mode to buffer backplane pins to local scan ports.
• Allows local taps to become tri-state for alternate test master control.

Specialized Applications

• Multidrop JTAG test bus environments.
• Board-level testing where modules can be removed while retaining access to remaining units.
• FPGA programming write pulse delivery.

Specialized Procurement Notes

Verify the NRND status before integration, as this designation indicates the component is not recommended for new designs. Confirm that the nFBGA-49 package footprint matches your PCB layout requirements. Ensure the 3.0V to 3.6V VCC supply range aligns with your system power architecture. Check for moisture sensitivity classification details prior to assembly processing.

Specialized Selection Notes

Select this component when a multidrop JTAG topology is required to isolate board failures without disrupting the entire test chain. The three local scan ports allow flexible configuration of scan rings. Consider the 7-slot input capacity for address allocation. Verify compatibility with IEEE 1149.4 analog bus support if applicable.

Specialized Part Context

The SCANSTA111 series extends the standard IEEE 1149.1 test bus into a multidrop environment. This approach improves test throughput compared to single serial chains. The device allows removal of a specific board while maintaining test access to other modules in the system. It serves as a bridge between the main test bus and local scan rings.

Specialized Replacement Considerations

Publicly confirmed substitute part numbers are not available in the provided documentation. Due to the NRND status, alternative components should be evaluated for long-term availability and functional equivalence regarding IEEE 1149.1 compliance and pinout compatibility.