SEARCH
— IC芯片 | 连接器 | 传感器 | 被动器件 —
The SN54HC00TDF1 is a quadruple 2-input positive-NAND gate manufactured by Texas Instruments. It utilizes high-speed CMOS technology and operates within a voltage range of 2V to 6V. The device features push-pull outputs with maximum source/sink currents of -5.2mA/5.2mA. It supports data rates up to 28 Mbps and functions across an operating temperature range of -55°C to 125°C. The component is supplied as a bare die.
Verify the specific die configuration and handling requirements for bare die components. Confirm radiation hardness levels and quality assurance documentation align with mission specifications. Ensure compatibility with existing packaging and assembly processes for unencapsulated semiconductor devices.
Select this component for designs requiring radiation-tolerant NAND logic in extreme environments. Consider the bare die format for custom packaging solutions. Evaluate power consumption and speed requirements against the HC family specifications. Ensure thermal management strategies accommodate the wide operating temperature range.
This part belongs to the SN54HC series, designed for space and military applications. It provides standard NAND functionality with enhanced durability compared to commercial variants. The TDF1 suffix indicates a specific die form factor suitable for hybrid microelectronics or custom integration.
SN54HC00-SP is a qualified alternative offering similar quad 2-input NAND functionality with space-rated specifications.