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SN74ABT18640DLR is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN TEST DEVICE 18BIT 56SSOP. Review the specifications below when checking this part for your BOM.
The SN74ABT18640DLR is an 18-bit inverting bus transceiver with integrated boundary-scan test circuitry, conforming to IEEE Standard 1149.1-1990. It operates within a supply voltage range of 4.5 V to 5.5 V and supports an industrial temperature range from -40°C to +85°C. The device utilizes BiCMOS technology for reduced power dissipation and is housed in a 56-pin SSOP package.
Verify the specific suffix 'DLR' corresponds to the SSOP-56 plastic shrink small-outline package configuration. Confirm that the component meets RoHS compliance standards as indicated by manufacturer documentation. Ensure the operating environment remains within the specified -40°C to +85°C temperature limits for reliable performance.
Select this component when designing systems requiring both high-speed bidirectional data transfer and comprehensive board-level testability. The integration of boundary-scan logic eliminates the need for external test controllers. Verify compatibility with existing IEEE 1149.1 infrastructure before implementation.
This device belongs to the Texas Instruments SCOPE family of testability products and the Widebus family. It is part of the SN54/74ABT series, which utilizes state-of-the-art EPIC-II BiCMOS design. The SN74 variant is distinguished from the SN54 military-grade version by its commercial temperature rating.
SN54ABT18640WDG
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