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SN74ABT8245DWR is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN TEST DEV W/OBT 24-SOIC. Review the specifications below when checking this part for your BOM.
The SN74ABT8245DWR is an octal bus transceiver with scan test capabilities manufactured by Texas Instruments. It operates within a supply voltage range of 4.5 V to 5.5 V and features TTL-compatible input and output levels. The device provides tri-state outputs with a low-level output current of 64 mA and a high-level output current of -32 mA. It exhibits a propagation delay of 3.9 ns and functions reliably across an operating temperature range from -40 °C to +85 °C. The component is housed in a 24-pin SOIC package.
Verify the specific datasheet revision and ordering suffix to ensure compatibility with required packaging formats. Confirm that the TTL input thresholds align with the source logic family in the target design. Check for any specific thermal management requirements associated with the SOIC-24 package during operation. Ensure compliance with RoHS directives if applicable to the manufacturing region.
Select this component when both high-speed data transfer and integrated scan test capabilities are required. It is suitable for designs needing strong drive strength for long traces or multiple loads. Consider the TTL interface compatibility against the system's logic standards. Evaluate the SOIC-24 footprint constraints against available board space compared to alternative packages.
This part belongs to the SN74ABT series, which utilizes advanced BiCMOS technology for high-speed performance. Unlike standard HC series devices, it offers significantly faster propagation delays and higher drive currents. The inclusion of scan test features distinguishes it from basic bus transceivers, making it ideal for manufacturing test and field diagnostics.
Direct substitutes include other SN74ABT8245 variants with different packaging options such as SN74ABT8245DW. Verify pinout compatibility before replacing with generic octal bus transceivers like the SN74ABTH245, noting differences in scan test integration.
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