SN74ABT8652DL

Specialty Logic Overview

The SN74ABT8652DL is a scan test device featuring octal bus transceivers and registers, belonging to the SCOPE family. It supports IEEE Standard 1149.1-1990 boundary-scan architecture via a 4-wire Test Access Port (TAP). The device utilizes EPIC-IIB BiCMOS design for reduced power dissipation. It operates within a supply voltage range of 4.5V to 5.5V and functions across an industrial temperature range of -40°C to +85°C. The component is housed in a 28-pin Shrink Small-Outline (DL) package.

Specialty Logic Feature Summary

• Integrates octal bus transceivers and registers with dedicated boundary-scan test circuitry compliant with IEEE 1149.1-1990 standards.
• Features a 4-wire TAP interface enabling parallel-signature analysis, pseudo-random pattern generation, and boundary self-test capabilities.
• Employs EPIC-IIB BiCMOS technology to significantly reduce power consumption while maintaining high-speed performance.

Specialty Logic Applications

• Testing complex circuit-board assemblies using boundary-scan methodology
• Facilitating board-level interconnect testing via JTAG interfaces
• Self-testing internal logic circuits through boundary-control register operations

Specialty Logic Procurement Notes

Verify the specific DL suffix indicates the Shrink Small-Outline package configuration. Confirm that the SN74 variant meets the required industrial temperature specifications (-40°C to +85°C) rather than military ranges. Ensure compatibility with existing IEEE 1149.1 test infrastructure before procurement.

Specialty Logic Selection Notes

Select this component when board-level testing requirements necessitate integrated boundary-scan cells alongside functional octal bus transceiver operations. The device is suitable for designs requiring simultaneous normal data transfer and test access without external test logic overhead. Consider the DL package dimensions for surface-mount layout constraints.

Specialty Logic Part Context

This part belongs to the Texas Instruments SCOPE family of testability products, designed specifically to support IEEE Standard 1149.1. It is functionally equivalent to the 'F652 and 'ABT652 devices in normal mode but includes additional scan-test features. The DL suffix denotes the shrink small-outline package option available for this series.

Specialty Logic Replacement Considerations

Functionally equivalent parts include the SN74ABT652 and SN74F652 for standard operation modes. Verify pinout compatibility and package dimensions when substituting with other octal bus transceivers lacking integrated boundary-scan capabilities.