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SN74ABT8652DW is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN TEST DEVICE 28-SOIC. Review the specifications below when checking this part for your BOM.
The SN74ABT8652DW is a scan test device featuring octal bus transceivers and registers, manufactured by Texas Instruments. It operates within a supply voltage range of 4.5 V to 5.5 V and supports an operating temperature range from -40°C to +85°C. The component utilizes a Plastic Small-Outline (DW) package with 28 pins. It implements the IEEE Standard 1149.1-1990 boundary-scan architecture via a 4-wire Test Access Port (TAP). In normal mode, it functions as an octal bus transceiver and register.
Verify that the specific part number matches the required package style and temperature grade. Confirm compliance with relevant industry standards for boundary-scan testing applications. Ensure that the sourcing channel provides authentic components from authorized distributors or manufacturers to guarantee reliability and specification adherence.
Select this component when boundary-scan testing capabilities are required alongside standard octal bus transceiver functionality. It is suitable for designs needing simultaneous normal operation and test access via the TAP interface. Consider the DW package constraints and voltage requirements during integration into the target system architecture.
This device belongs to the Texas Instruments SCOPE family of testability products. It is functionally equivalent to the 'F652 and 'ABT652 in normal-function mode. The SN74ABT8652 is characterized for commercial temperature ranges, while the SN54ABT8652 variant covers military specifications. It supports optional instructions such as INTEST, CLAMP, and HIGHZ.
Functionally equivalent parts include the 'F652 and 'ABT652 in normal-operation modes.
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