SN74ABT8652DWR

Specialty Logic Overview

The SN74ABT8652DWR is a scan test device from the Texas Instruments SCOPE family, featuring octal bus transceivers and registers. It supports IEEE Standard 1149.1-1990 boundary-scan architecture via a 4-wire Test Access Port (TAP). The device operates on a single VCC supply within the -40°C to +85°C temperature range. It utilizes EPIC-IIB BiCMOS design for reduced power dissipation and includes an 8-bit instruction register, a 38-bit boundary-scan register, an 11-bit boundary-control register, and a bypass register.

Specialty Logic Feature Summary

• Integrates octal bus transceivers and registers with dedicated scan-test circuitry for board-level testing.
• Supports IEEE Standard 1149.1-1990 boundary-scan architecture using a four-wire TAP interface.
• Enables parallel-signature analysis and pseudo-random pattern generation through the boundary-control register.
• Maintains functional equivalence to standard 'F652 and 'ABT652 devices in normal operating mode.

Specialty Logic Applications

• Boundary-scan testing of complex circuit-board assemblies
• Self-testing of integrated-circuit boundary cells
• In-system testing utilizing JTAG interfaces

Specialty Logic Procurement Notes

Verify that the specific DWR suffix corresponds to the Plastic Small-Outline package as documented in the SCBS122F datasheet. Confirm that the component meets the specified commercial temperature range of -40°C to +85°C. Ensure compatibility with the required 4-wire TAP interface signals for proper integration into the target system architecture.

Specialty Logic Selection Notes

Select this component when board-level testing capabilities are required alongside standard octal bus transceiver functionality. The device is suitable for designs needing simultaneous data transfer and boundary-scan access without interrupting normal logic operations. Consider the 28-pin SOIC package constraints and the specific control requirements for the TAP controller states during system design.

Specialty Logic Part Context

This part belongs to the Texas Instruments SCOPE family of testability products, designed specifically to facilitate the testing of complex electronic assemblies. It implements the EPIC-IIB BiCMOS technology to optimize performance and power consumption while adhering to industry-standard boundary-scan protocols established by the IEEE.

Specialty Logic Replacement Considerations

SN54ABT8652JT

Specialty Logic FAQ

How does the device handle normal operation versus test mode?

Activating the TAP in normal mode does not affect the functional operation of the bus transceivers and registers. In test mode, normal operation is inhibited to allow observation and control of the I/O boundary via the scan registers.

What is the function of the Boundary-Control Register (BCR)?

The 11-bit BCR is used to implement additional test operations such as pseudo-random pattern generation, parallel-signature analysis with masking, and binary counting when the RUNT instruction is executed.