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SN74ABT8952DWR is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN TEST DEVICE 28SOIC. Review the specifications below when checking this part for your BOM.
The SN74ABT8952DWR is a scan test device with octal registered bus transceivers from the Texas Instruments SCOPE family. It supports IEEE Standard 1149.1-1990 boundary scan via a 4-wire TAP interface. The device operates on a single VCC supply between 4.5 V and 5.5 V, with an operating temperature range of -40°C to +85°C. It utilizes BiCMOS technology for reduced power dissipation.
Verify the specific package variant (DW) against the required footprint. Confirm that the design accommodates the four dedicated test pins (TDI, TDO, TMS, TCK). Ensure the system logic correctly handles the internal pullups on TDI and TMS when these pins are left unconnected in normal operation modes.
Select this component when board-level testing requires integrated boundary-scan capabilities alongside standard octal registered bus transceiver functions. It serves as a functional equivalent to the 'BCT2952 and 'ABT2952 in normal mode while providing additional SCOPE instruction set support for manufacturing test.
This device belongs to the Texas Instruments SCOPE family of testability products. It is designed to facilitate the testing of complex assemblies by integrating test access port functionality directly with the data bus transceiver logic, eliminating the need for separate boundary-scan controllers.
The datasheet notes functional equivalence to the 'BCT2952 and 'ABT2952 in normal-function mode. Verify pinout compatibility and instruction set support before substitution.
Internal pullup resistors force both TDI and TMS to a high level if they are left unconnected or open-circuited due to board defects.
In test mode, the normal operation of the registered bus transceivers is inhibited to allow observation and control of the I/O boundary. In normal mode, activating the TAP does not affect functional operation.
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