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SN74BCT8240ANT is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN TEST DEVICE BUFF 24-DIP. Review the specifications below when checking this part for your BOM.
The SN74BCT8240ANT is an octal inverting buffer and line driver with three-state outputs, belonging to the Texas Instruments SCOPE testability family. It supports IEEE Standard 1149.1-1990 boundary-scan architecture via a four-wire Test Access Port (TAP). The device operates within a supply voltage range of 4.5 V to 5.5 V and functions over a commercial temperature range of 0°C to 70°C. In normal mode, it is functionally equivalent to standard octal buffers.
Verify that the ordering suffix 'NT' corresponds to the specified plastic DIP package configuration. Confirm the device meets the required commercial operating temperature range of 0°C to 70°C. Ensure compatibility with the 4.5 V to 5.5 V supply voltage specifications. Validate that the component conforms to the IEEE Standard 1149.1-1990 requirements for your specific test infrastructure.
Select this component when board-level testing requires integrated boundary-scan capabilities alongside standard buffering functions. It serves as a suitable alternative to non-scan devices like the SN74BCT240 when testability features are mandatory. Consider the PDIP-20 package availability if through-hole mounting is necessary for the assembly process.
This part belongs to the SN54/74BCT8240A series, which integrates scan test structures into standard octal buffer designs. The SCOPE family provides enhanced testability without compromising normal functional performance. The device includes dedicated registers for instruction handling, boundary scanning, and bypass operations to facilitate comprehensive system-level diagnostics.
Functionally equivalent to the SN74BCT240 in normal-operation mode. Verify pinout compatibility with existing PCB layouts before substitution.
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