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SN74BCT8244ANTG4 is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN TEST DEVICE BUFF 24-DIP. Review the specifications below when checking this part for your BOM.
The SN74BCT8244ANTG4 is an octal buffer and line driver with scan test capabilities, belonging to the SCOPE family. It supports IEEE Standard 1149.1-1990 boundary-scan architecture for testing complex circuit-board assemblies. The device features a four-wire Test Access Port (TAP) interface comprising TDI, TDO, TMS, and TCK terminals. In normal mode, it functions equivalently to standard BCT244 buffers. The SN74BCT8244A operates within a temperature range of 0°C to 70°C.
Verify that the specific ordering suffix 'TG4' corresponds to the intended package type and lead-free manufacturing process as defined in the official Texas Instruments datasheet. Confirm that the component meets RoHS compliance requirements for the target application environment. Ensure compatibility with existing IEEE 1149.1 test infrastructure before procurement.
Select this component when design requirements include both standard octal buffering functionality and comprehensive board-level testability. The device is suitable for applications requiring integration with JTAG-compliant test equipment. Consider the commercial temperature range limitations if operation outside 0°C to 70°C is necessary, in which case the military-grade SN54 variant should be evaluated.
This part belongs to the SN54/74BCT8244A series of scan test devices with octal buffers. It is a member of the Texas Instruments SCOPE family of testability products. The device provides functional equivalence to standard logic buffers while adding extensive diagnostic capabilities through its integrated boundary-scan architecture.
The SN54BCT8244A serves as the military-grade equivalent offering extended temperature range. For non-scan applications, standard octal buffers like the SN74BCT244 provide functional parity without test circuitry.
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