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SN74BCT8373ADWR is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN TEST DEVICE LATCH 24SOIC. Review the specifications below when checking this part for your BOM.
The SN74BCT8373ADWR is an octal D-type latch scan test device from the Texas Instruments SCOPE family. It supports IEEE Standard 1149.1-1990 boundary-scan architecture via a 4-wire Test Access Port (TAP). The device operates within a supply voltage range of 4.5V to 5.5V and functions over a commercial temperature range of 0°C to 70°C. In normal mode, it is functionally equivalent to standard octal latches.
Verify component authenticity against official Texas Instruments documentation. Confirm package integrity and pin alignment with the 24-SOIC specification. Ensure compliance with RoHS3 standards and check for any specific handling requirements related to the surface-mount configuration before integration.
Select this component when IEEE 1149.1-1990 compliance is required for manufacturing testability. It serves as a suitable alternative to standard octal latches in designs needing integrated scan capabilities. Verify that the 4.5V to 5.5V operating range matches the system power supply constraints.
This device belongs to the Texas Instruments SCOPE family of testability products. It provides enhanced diagnostic capabilities while maintaining compatibility with standard octal latch functionality. The part integrates specialized test registers alongside conventional data storage elements for comprehensive board-level verification.
The SN74BCT8373A is functionally equivalent to the 'F373 and 'BCT373 in normal-function mode. Verify pinout compatibility and electrical specifications before substituting with other octal latch variants.
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