Specialty Logic SN74BCT8373ADWR product image

SN74BCT8373ADWR

$3.16
  • Description:IC SCAN TEST DEVICE LATCH 24SOIC
  • Series:74BCT
  • Mfr:Texas Instruments
  • Package:Tape & Reel (TR),Bulk

SKU:267a66264ec5 Category: Brand:

  
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SN74BCT8373ADWR is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN TEST DEVICE LATCH 24SOIC. Review the specifications below when checking this part for your BOM.

Specialty Logic specifications for SN74BCT8373ADWR

  • Description:IC SCAN TEST DEVICE LATCH 24SOIC
  • Series:74BCT
  • Mfr:Texas Instruments
  • Package:Tape & Reel (TR),Bulk
  • Logic Type:Scan Test Device with D-Type Latches
  • Supply Voltage:4.5V ~ 5.5V
  • Number of Bits:8
  • Operating Temperature:0°C ~ 70°C
  • Mounting Type:Surface Mount
  • Package / Case:24-SOIC (0.295", 7.50mm Width)
  • Supplier Device Package:24-SOIC
  • Grade:-
  • Qualification:-

Specialty Logic datasheet and documents for SN74BCT8373ADWR

SN74BCT8373ADWR

Specialty Logic Overview

The SN74BCT8373ADWR is an octal D-type latch scan test device from the Texas Instruments SCOPE family. It supports IEEE Standard 1149.1-1990 boundary-scan architecture via a 4-wire Test Access Port (TAP). The device operates within a supply voltage range of 4.5V to 5.5V and functions over a commercial temperature range of 0°C to 70°C. In normal mode, it is functionally equivalent to standard octal latches.

Specialty Logic Feature Summary

  • Supports IEEE Standard 1149.1-1990 boundary-scan architecture for complex circuit board testing
  • Integrates dedicated test terminals including TDI, TDO, TMS, and TCK for serial test bus control
  • Enables parallel signature analysis and pseudo-random pattern generation through the boundary-control register
  • Maintains normal logic operation during test access port activation without functional interference

Specialty Logic Applications

  • Boundary-scan testing of complex circuit board assemblies
  • Self-test operations on boundary test cells
  • Parallel signature analysis at device inputs
  • Pseudo-random pattern generation from device outputs

Specialty Logic Procurement Notes

Verify component authenticity against official Texas Instruments documentation. Confirm package integrity and pin alignment with the 24-SOIC specification. Ensure compliance with RoHS3 standards and check for any specific handling requirements related to the surface-mount configuration before integration.

Specialty Logic Selection Notes

Select this component when IEEE 1149.1-1990 compliance is required for manufacturing testability. It serves as a suitable alternative to standard octal latches in designs needing integrated scan capabilities. Verify that the 4.5V to 5.5V operating range matches the system power supply constraints.

Specialty Logic Part Context

This device belongs to the Texas Instruments SCOPE family of testability products. It provides enhanced diagnostic capabilities while maintaining compatibility with standard octal latch functionality. The part integrates specialized test registers alongside conventional data storage elements for comprehensive board-level verification.

Specialty Logic Replacement Considerations

The SN74BCT8373A is functionally equivalent to the 'F373 and 'BCT373 in normal-function mode. Verify pinout compatibility and electrical specifications before substituting with other octal latch variants.

SN74BCT8373ADWRSN74BCT8373ADWR
$3.16
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