SN74BCT8373ANT

Specialty Logic Overview

The SN74BCT8373ANT is an octal D-type latch scan test device from the Texas Instruments SCOPE family. It supports IEEE Standard 1149.1-1990 boundary-scan architecture via a 4-wire Test Access Port (TAP). The device operates within a supply voltage range of 4.5V to 5.5V and is characterized for commercial temperatures from 0°C to 70°C. It features an 8-bit instruction register, an 18-bit boundary-scan register, a 2-bit boundary-control register, and a bypass register.

Specialty Logic Feature Summary

• Supports IEEE Standard 1149.1-1990 boundary-scan testing through a dedicated four-wire TAP interface.
• Functionally equivalent to standard octal D-type latches in normal operation mode.
• Enables parallel signature analysis and pseudo-random pattern generation for internal self-testing.
• Includes optional test reset functionality triggered by double-high-level voltage on the TMS pin.

Specialty Logic Applications

• Testing complex circuit board assemblies using boundary-scan methodology.
• Implementing test access ports for integrated circuit verification.
• Performing parallel signature analysis on data inputs.
• Generating pseudo-random patterns from device outputs for self-test operations.

Specialty Logic Procurement Notes

Verify that the specific suffix 'NT' corresponds to the plastic 300-mil DIP package as documented in the datasheet. Confirm the component meets the commercial temperature range specifications of 0°C to 70°C. Ensure compatibility with the required 4.5V to 5.5V supply voltage levels for proper logic operation.

Specialty Logic Selection Notes

Select this component when boundary-scan testability is required for designs utilizing octal D-type latches. It serves as a direct functional replacement for standard BCT373 devices during normal operation while adding comprehensive test infrastructure. Consider the package constraints and operating temperature requirements before integration into the system design.

Specialty Logic Part Context

This device belongs to the Texas Instruments SCOPE family of testability products. It integrates standard latch functionality with advanced test structures compliant with IEEE 1149.1 standards. The inclusion of dedicated test terminals allows for non-intrusive testing of board assemblies without requiring physical test points.

Specialty Logic Replacement Considerations

The SN74BCT8373A is functionally equivalent to the SN74F373 and SN74BCT373 in normal mode. Verify package compatibility if substituting with other variants in the same logical family.