SN74BCT8373DWR

Specialty Logic Overview

The SN74BCT8373DWR is an octal D-type latch scan test device manufactured by Texas Instruments. It operates within a supply voltage range of 4.5V to 5.5V and features a 24-pin SOIC package. The component supports boundary scan testing architectures, integrating eight D-type latches with scan capabilities for high-speed digital applications.

Specialty Logic Feature Summary

• Integrates octal D-type latches specifically designed for scan test functionality
• Supports boundary scan architecture for comprehensive circuit verification
• Utilizes BCT logic family technology for optimized performance

Specialty Logic Applications

• Boundary scan testing systems
• Digital circuit verification environments
• Scan chain implementation in complex logic designs

Specialty Logic Procurement Notes

Verify the specific suffix 'DWR' corresponds to the tape-and-reel packaging format required for automated assembly processes. Confirm that the 24-SOIC footprint matches the target PCB layout dimensions. Ensure compatibility with the 4.5V to 5.5V power domain before integration into the final design.

Specialty Logic Selection Notes

Select this component when boundary scan testability is a primary requirement for the digital system. It is suitable for designs needing integrated scan control within standard logic families. Consider the 24-pin package constraints and ensure the operating voltage aligns strictly with the specified 4.5V to 5.5V range for reliable operation.

Specialty Logic Part Context

This part belongs to the SN74BCT series, which combines BiCMOS speed with CMOS low power consumption. The 8373 variant is distinct from standard latches due to its dedicated scan test inputs, facilitating manufacturing test coverage without external test equipment overhead.

Specialty Logic Replacement Considerations

Public confirmed substitute part numbers are not available in the provided documentation.