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The SN74F00NE4 is a quadruple 2-input positive-NAND gate manufactured by Texas Instruments. It operates within a supply voltage range of 4.5 V to 5.5 V and supports an operating free-air temperature range of 0 °C to 70 °C. The device features high-level output current of -1 mA and low-level output current of 20 mA. Switching characteristics at VCC = 5 V with CL = 50 pF include propagation delays (tPLH) ranging from 1.6 ns to 6 ns, and (tPHL) ranging from 1 ns to 5.3 ns.
Verify the specific ordering suffix 'E4' corresponds to lead-free packaging requirements as indicated in TI documentation. Confirm that the NRND status does not impact long-term availability for your production timeline. Ensure compatibility with existing PCB footprints for the PDIP package type before finalizing procurement decisions.
Select this component when four independent NAND gates are required in a through-hole DIP package. Consider the SN74F00DR or SN74F00NSR if surface-mount assembly is preferred. Evaluate the SN54F00 variants if military-grade temperature specifications (-55 °C to 125 °C) are necessary for the application environment.
This part belongs to the SN74F00 family of quadruple 2-input positive-NAND gates. It shares functional equivalence with other members like SN74F00D and SN74F00N but differs in packaging and environmental qualification. The 'NE4' designation specifically identifies the PDIP package variant with lead-free compliance.
SN74F00N
The maximum low-level output current (IOL) is specified as 20 mA under recommended operating conditions.
No, the SN74F00NE4 does not feature Schmitt trigger inputs; it utilizes standard TTL-compatible input thresholds.