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SN74LVC1G58DRLR is listed in the Gates And Inverters - Multi-Function, Configurable range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC CONFIG MULTI-FUNC GATE SOT563. Review the specifications below when checking this part for your BOM.
The SN74LVC1G58DRLR is a configurable multiple-function gate from Texas Instruments, operating within a 1.65-V to 5.5-V supply voltage range. It features three inputs and one output, allowing the selection of eight logic patterns including AND, OR, NAND, NOR, XOR, inverter, and noninverter functions. The device supports ±32-mA output drive at 3.3 V and exhibits a maximum propagation delay of 6.3 ns at 3.3 V. It operates across an extended temperature range of -40°C to +125°C and includes Schmitt trigger action for noise immunity.
Verify the specific package marking code against the Package Ordering Addendum to confirm the exact physical housing variant. Ensure that the ordering suffix matches the required reel quantity and lead finish specifications. Confirm RoHS compliance status and moisture sensitivity level ratings prior to final procurement decisions.
Select this component when a single gate must perform multiple distinct logic operations without external configuration hardware. The wide supply voltage range accommodates various system architectures. Verify that the input threshold characteristics align with the driving source signal levels to ensure reliable switching performance.
This device belongs to the SN74LVC1Gxx series of single-gate logic ICs. It utilizes Texas Instruments' NanoFree™ packaging technology to achieve a compact footprint suitable for space-constrained printed circuit board designs. The DRL package designation indicates a SOT-5X3 surface-mount housing.
SN74LVC1G58DBVR
The output state is determined by connecting the three inputs (In0, In1, In2) to either VCC or GND, which selects one of eight predefined logic patterns.
The Ioff circuitry disables the outputs when the device is powered down, preventing damaging current backflow through the device during partial-power-down applications.
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