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The SN74LVT18502PM is a specialized logic device from Texas Instruments, classified as a scan test device with universal bus transceivers. It operates within a supply voltage range of 2.7 V to 3.6 V and supports an operating temperature range of -40°C to +85°C. The component is housed in a 64-pin LQFP package and utilizes BiCMOS technology. Designed for boundary-scan testing, it facilitates compliance with IEEE Standard 1149.1-1990 protocols when enabled.
Verify the exact suffix 'PM' corresponds to the 64-LQFP tray packaging configuration. Confirm RoHS compliance status through official manufacturer documentation or authorized distributor declarations prior to procurement. Ensure the specific revision level matches design requirements.
Select this component for applications requiring integrated boundary-scan capabilities alongside bus transceiving functions. It serves as a specialized alternative to standard logic gates in test-oriented designs. Consider the 64-pin LQFP footprint for PCB layout compatibility and verify thermal management needs for the specified operating temperature range.
This part belongs to the SN74LVT series of low-voltage TTL-compatible logic devices. It is functionally related to the SN74LVTH18502A and SN74ABT18502 families, which share similar scan test and bus transceiver architectures. The device is manufactured by Texas Instruments under their specialty function logic portfolio.
Public confirmed substitutes include SN74LVTH18502APM and SN74ABT18502PM. Verify pinout and electrical specifications against the target application before substitution.