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SN74LVTH182502APM is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN-TEST-DEV/XCVR 64-LQFP. Review the specifications below when checking this part for your BOM.
The SN74LVTH182502APM is a specialized logic integrated circuit manufactured by Texas Instruments, belonging to the 74LVTH series. It functions as an ABT scan test device equipped with an 18-bit universal bus transceiver. The component operates within a supply voltage range of 2.7V to 3.6V and supports a wide operating temperature range from -40°C to +85°C. It is housed in a 64-LQFP package measuring 10x10 mm, designed for surface mount technology applications requiring high-density integration.
Verify the specific suffix 'PM' against the datasheet to confirm the tray packaging configuration, as it differs from the 'MR' reel variant. Ensure the order matches the exact 64-LQFP footprint requirements. Confirm RoHS compliance status and moisture sensitivity level (MSL 3) prior to assembly planning to prevent soldering defects during reflow processes.
Select this component when an 18-bit bidirectional data path is required within a scan chain environment. The LVTH technology ensures compatibility with 3.3V logic families while maintaining low power consumption. Verify that the 64-pin LQFP package fits the PCB layout constraints and thermal management requirements of the target application design.
This part belongs to the Texas Instruments 74LVTH family, which utilizes Advanced BiCMOS Technology (ABT). This technology provides high-speed performance with low power dissipation. The 182502A designation indicates a specific configuration optimized for scanning and testing applications, distinguishing it from standard bus transceivers used in general-purpose computing.
Check for SN74LVTH182502APMR if reel packaging is preferred instead of trays. Verify pin-to-pin compatibility with other 18-bit ABT transceivers from the same manufacturer before substitution.
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