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SN74LVTH182646APM is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC SCAN-TEST-DEV/XCVR 64-LQFP. Review the specifications below when checking this part for your BOM.
The SN74LVTH182646APM is a 3.3-V ABT scan test device featuring 18-bit transceivers and registers, manufactured by Texas Instruments. It operates within a supply voltage range of 2.7 V to 3.6 V and supports an operating temperature range from -40°C to +85°C. The component is housed in a 64-pin LQFP package with dimensions of 10x10 mm. Designed for specialty function logic applications, it integrates boundary scan capabilities suitable for high-speed digital testing environments.
Verify the specific suffix 'APM' corresponds to the 64-LQFP tray packaging configuration. Confirm moisture sensitivity level requirements for surface-mount assembly processes. Ensure the 3.3-V supply rail matches the system design specifications before integration.
Select this component when 18-bit parallel data transfer with internal registration is required. It is suitable for designs needing integrated boundary scan functionality without external logic. Consider the LQFP-64 footprint constraints and thermal dissipation characteristics for PCB layout planning.
This part belongs to the SN74LVTH182646A series of specialty logic ICs. It is part of Texas Instruments' ABT family, which combines advanced CMOS technology with Schottky diode protection. The series is designed for high-performance scanning and data routing applications in industrial and communication systems.
The SN74ABT182646APM is a related variant within the same functional family. Verify pin compatibility and electrical parameter differences before substitution. Consult official datasheets for detailed cross-reference information.
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