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SN74LVTH18504APMR is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is IC 20BIT SCAN TST DEV UBT 64LQFP. Review the specifications below when checking this part for your BOM.
The SN74LVTH18504APMR is a 3.3-V ABT scan test device featuring 20-bit universal bus transceivers, manufactured by Texas Instruments. It operates within an ambient temperature range of -40°C to 85°C and is housed in a 64-LQFP package measuring 10x10 mm. This component integrates scan test capabilities with high-performance logic functions, designed for low-power applications requiring versatile data transfer across multiple bits.
Verify the complete part number including the suffix 'APMR' to ensure correct package type (LQFP) and temperature grade (-40 to 85°C). Confirm moisture sensitivity level requirements during storage and handling. Cross-reference with official Texas Instruments documentation to validate pinout and electrical specifications against design schematics before procurement.
Select this component when a 3.3-V logic family with integrated scan test features is required. The 20-bit width suits wide-bus applications. Ensure the 64-LQFP footprint fits the PCB layout constraints. Verify that the operating temperature range meets the environmental conditions of the target application.
This device belongs to the Texas Instruments SN74LVTH185xx series of 3.3-V ABT scan test devices. These components are designed to provide universal bus transceiver functionality while supporting scan chain testing, making them suitable for complex digital systems requiring both data transmission and diagnostic verification capabilities.
Check for compatible parts within the same SN74LVTH185xx family with matching bit widths and package types. Verify functional equivalence regarding scan test support and voltage levels before substitution.
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