SN74LVTH18512DGGR

Overview

The SN74LVTH18512DGGR is a 3.3-V ABT scan test universal bus transceiver manufactured by Texas Instruments. It features an 18-bit configuration housed in a 64-pin TSSOP package. The device supports boundary scan operations and includes dedicated control inputs for scan test functionality. It operates within a voltage range of 2.7 V to 3.6 V and functions across temperatures from -40°C to +85°C.

Feature Summary

• Supports boundary scan testing via dedicated control inputs
• Provides 18-bit data transmission capability
• Operates at 3.3-V logic levels

Applications

• Boundary scan testing systems
• Universal bus interfacing
• Scan test architecture integration

Procurement Notes

Verify the specific suffix DGGR corresponds to the 64-TSSOP package and reel packaging format. Confirm that the ABT technology family aligns with system requirements for 3.3-V operation. Ensure compatibility with existing boundary scan infrastructure before procurement.

Selection Notes

Select this component when an 18-bit universal bus transceiver with integrated scan test capabilities is required. It is suitable for designs needing boundary scan support at 3.3-V levels. Consider the 64-TSSOP package constraints for PCB layout.

Part Context

This part belongs to the SN74LVTH series of 3.3-V ABT logic devices. It is designed for high-performance digital applications requiring universal bus transfer and scan test features. The LVTH series typically offers improved speed and lower power consumption compared to older LVT families.

Replacement Considerations

Check for direct substitutes within the SN74LVTH18512 family with different package options. Verify pinout compatibility if considering alternative manufacturers' universal bus transceivers with similar bit widths and scan test support.