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The SN74LVTH18514DGGR is a 3.3-V ABT scan test device featuring a 20-bit universal bus transceiver, manufactured by Texas Instruments. It operates within a supply voltage range of 2.7 V to 3.6 V and supports LVTTL input and output levels. The component provides a low-level output current of 64 mA and a high-level output current of -32 mA, with a propagation delay of 6.8 ns. It is housed in a 64-pin TSSOP package and functions as a non-inverting, three-state bus transceiver suitable for surface-mount installation.
Verify the exact part number suffix against official Texas Instruments documentation to ensure correct package and temperature grade compatibility. Confirm that the specific revision matches your design requirements, as manufacturing updates may occur. Always check the latest datasheet for any changes in electrical characteristics or pinout configurations before finalizing procurement decisions.
Select this component when a 20-bit wide bus interface is required for scan testing purposes. Ensure the system operates within the 2.7 V to 3.6 V supply range and utilizes LVTTL compatible signals. Consider the 64-pin TSSOP package constraints for PCB layout and thermal management during the selection process.
This device belongs to the Texas Instruments LVTH series, which focuses on low-voltage transistor-transistor logic performance. It is part of a family of specialty function logic devices designed for advanced digital applications, offering robust performance in mixed-signal environments while maintaining compatibility with standard logic families.
Check for SN74LVTH18511DGGRG4 as a related variant with different bit widths. Verify functional equivalence with other 20-bit universal bus transceivers from the same manufacturer family before substitution.