SEARCH
— IC芯片 | 连接器 | 传感器 | 被动器件 —
SNJ54BCT8244AFK is listed in the Specialty Logic range at ChipApex. The manufacturer field lists Texas Instruments. Its product description is 54BCT8244A SCAN TEST DEVICES WIT. Review the specifications below when checking this part for your BOM.
The SNJ54BCT8244AFK is a specialty function logic device from Texas Instruments, classified as a scan test device with octal buffers. It belongs to the SCOPE™ testability integrated-circuit family. The component operates within an extended temperature range of -55°C to 125°C and is housed in a 28-LCCC package.
Verify the specific suffix 'FK' against official Texas Instruments documentation to confirm exact pinout, marking, and qualification status. Ensure the 28-LCCC package matches the design footprint. Confirm that the -55 to 125°C operating range meets the environmental requirements of the target application before procurement.
Select this component when dedicated scan test infrastructure with octal buffering is required. The BCT series offers specific performance characteristics suitable for high-speed logic applications. Verify compatibility with existing test patterns and board layout constraints associated with the LCCC package form factor.
This part is a military-grade or high-reliability variant (indicated by the 'SNJ' prefix) of the SN54BCT8244A. It shares functional similarities with other SCOPE™ family devices but is distinguished by its specific packaging and extended temperature rating. It serves niche applications requiring robust testability features.
The SN54BCT8244A is the base commercial/industrial equivalent. Verify if the 'FK' suffix denotes a specific tape-and-reel or qualification standard that differs from standard bulk packages. Cross-reference with 5962-9172601M3A markings if available.
Explore related parts through Logic, Integrated Circuits (ICs), all product categories, ChipApex homepage.