TI85N576I3

Field Programmable Gate Array Overview

The TI85N576I3 is a Titanium series Field Programmable Gate Array (FPGA) manufactured by Efinix, Inc. It features a 576-ball BGA package and includes 133 general-purpose I/O pins along with 300 Digital Signal Processing (DSP) blocks. This component is designed for compute-intensive workloads requiring high performance and low power consumption.

Field Programmable Gate Array Feature Summary

• Supports AI acceleration and real-time decision making through integrated DSP capabilities
• Utilizes the Quantum compute fabric for high-density logic implementation
• Provides flexible I/O interface options for system integration

Field Programmable Gate Array Applications

• AI acceleration tasks
• Data analysis processing
• Real-time decision making systems

Field Programmable Gate Array Procurement Notes

Verify the manufacturer part number against official Efinix documentation to ensure authenticity. Confirm that the device matches the specified Titanium family characteristics and package type before procurement. Request datasheets directly from authorized channels to validate technical specifications.

Field Programmable Gate Array Selection Notes

Select this FPGA when design requirements involve significant digital signal processing alongside general logic functions. The inclusion of dedicated DSP blocks makes it suitable for applications demanding efficient arithmetic operations within a reconfigurable hardware environment.

Field Programmable Gate Array Part Context

This component belongs to the Titanium FPGA family from Efinix, which targets high-performance embedded applications. The family emphasizes low power consumption while delivering substantial computational throughput, positioning these devices for modern edge computing and industrial control scenarios.

Field Programmable Gate Array Replacement Considerations

Consult official Efinix substitution guides for compatible alternatives within the Titanium or Trion families. Verify pin compatibility and resource availability before considering cross-model replacements.