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The TL431QDBZR-QR is a programmable shunt regulator manufactured by Nexperia, designed for precision voltage reference and control applications. It operates within a cathode voltage range of 2.5 V to 36 V and provides an adjustable output voltage via two external resistors. The device features a typical temperature drift of 90 ppm/°C over the 0°C to 70°C range and supports a cathode current range from 1 mA to 100 mA. It is housed in a SOT-23 (TO-236AB) surface-mount package and carries AEC-Q101 qualification for automotive reliability.
Verify the specific suffix 'QR' against the official Nexperia datasheet to confirm reel packaging specifications and tape-and-reel dimensions. Ensure the component meets the required AEC-Q101 grade for your target automotive or industrial environment. Cross-reference the manufacturer part number with authorized distributor catalogs to validate authenticity and traceability before finalizing procurement orders.
Select this component when a high-precision, low-cost programmable shunt regulator is required for space-constrained designs. The SOT-23 package offers a compact footprint ideal for dense PCB layouts. Consider the thermal performance and maximum cathode current limits relative to the expected load conditions. Verify that the external resistor network can achieve the desired accuracy given the device's inherent tolerance specifications.
This part belongs to the TL431 family of programmable shunt regulators, widely used as voltage references and error amplifiers. The 'Q' designation typically indicates automotive-grade qualification, while 'DBZR' specifies the SOT-23 surface-mount package and reel packaging format. It serves as a direct replacement for legacy industry-standard devices in various power management and control circuit topologies.
Direct pin-compatible substitutes include other AEC-Q101 qualified TL431 variants from different manufacturers, provided they match the SOT-23 package and electrical characteristics. Verify that alternative parts meet the same temperature drift and initial accuracy requirements for critical reference applications.