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The TSX393IDT is a micropower dual CMOS voltage comparator manufactured by STMicroelectronics. It features an open-drain output and operates within a supply voltage range of 2.7 V to 16 V. The device draws a typical operating current of 11 µA per channel. Key electrical parameters include a response time of 2.4 µs, an input offset voltage of 5 mV, and an input bias current of 10 pA. It provides a maximum output current of 20 mA per channel and supports a common-mode rejection ratio of 90 dB. The component is housed in an SOIC-8 package and functions reliably across a temperature range from -40°C to +125°C.
Verify the specific suffix IDT corresponds to the SOIC-8 surface-mount package when sourcing. Confirm RoHS compliance status through official manufacturer documentation prior to integration. Ensure the ordering code matches the required reel or cut-tape packaging format for automated assembly processes. Cross-reference the datasheet revision to validate parameter consistency against design specifications.
Select this component when designing circuits that demand low power dissipation alongside adequate speed for general-purpose comparison tasks. The open-drain output simplifies interfacing with different voltage domains without additional level-shifting components. Consider the thermal performance within the SOIC-8 package if operating near the upper temperature limits. Evaluate the 11 µA current draw against strict battery life requirements compared to higher-speed alternatives.
This part belongs to the TSX393 series, which serves as an improved version of the legacy TS393 comparator. The series offers enhanced ESD tolerance and lower input offset voltage while maintaining compatibility with existing designs. It is available in multiple packages including MiniSO8 and DFN8 for space-constrained applications. The TSX393IDT specifically denotes the SOIC-8 variant optimized for standard surface-mount technology workflows.
The TS393 is the direct predecessor and pin-compatible alternative, though it exhibits higher current consumption and lower ESD ratings. Verify functional equivalence regarding output drive strength and propagation delay differences before substitution.