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2SD0601ARL is listed in the Single Bipolar Transistors range at ChipApex. The manufacturer field lists Panasonic Electronic Components. Its product description is TRANS NPN 50V 0.1A MINI3-G1. Review the specifications below when checking this part for your BOM.
The Panasonic 2SD0601ARL is a silicon NPN epitaxial planar transistor designed for general amplification. It features a Mini3-G1 package and operates with a collector-emitter voltage of 50 V and a continuous collector current of 100 mA. The device offers a high forward current transfer ratio (hFE) ranging from 160 to 460 depending on the rank, and a low collector-emitter saturation voltage of 0.3 V maximum at rated conditions. Transition frequency reaches 150 MHz.
Verify the specific suffix 'L' against official documentation to confirm if it denotes a unique packaging or ranking variant distinct from the standard 2SD0601A. Confirm RoHS compliance status and check the manufacturer's lifecycle page for maintenance or discontinuation notices before finalizing procurement plans.
Select this component for applications requiring compact surface-mount solutions with reliable linear amplification characteristics. Ensure the design accommodates the 200 mW power dissipation limit and verify that the required hFE gain falls within the specified Q, R, S, or no-rank classifications provided in the datasheet.
This part belongs to the 2SD0601A series of small signal bipolar transistors manufactured by Panasonic Electronic Components. It serves as an NPN counterpart to the PNP 2SB0709A, forming a complementary pair suitable for push-pull amplifier configurations and general-purpose switching tasks in consumer electronics.
The 2SB0709A is documented as the complementary PNP transistor. Verify pinout compatibility and electrical ratings when substituting with other NPN transistors in the TO-236 or Mini3-G1 packages.
The maximum collector-emitter voltage (VCEO) is 50 V.
Yes, the product complies with the RoHS Directive (EU 2002/95/EC).
The transition frequency (fT) is 150 MHz under specified test conditions.
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