5CEFA7U19I7

Overview

The Altera 5CEFA7U19I7 is a Cyclone V E field-programmable gate array featuring 149,500 logic cells and 240 I/Os in a 484-pin UBGA package. It includes 7.7 Mbits of embedded memory and supports a maximum operating frequency of 925 MHz. The device operates at 1.1V with a temperature range of -40°C to 100°C.

Feature Summary

• High-density programmable logic architecture
• Integrated embedded memory resources
• Industrial-grade thermal performance

Applications

• Industrial automation control systems
• Telecommunications infrastructure equipment
• Automotive electronic control units

Procurement Notes

Verify the specific suffix 'I7' against official Intel/Altera documentation to confirm industrial temperature rating and pinout compatibility. Ensure the ordering part number matches the exact package variant required for your PCB layout. Cross-reference the manufacturer's latest datasheet revision to avoid discrepancies in electrical specifications or mechanical dimensions during procurement.

Selection Notes

Select this component when high logic density and significant embedded memory are required within a compact 484-pin footprint. It is suitable for designs needing robust industrial temperature operation up to 100°C junction temperature. Consider its power consumption characteristics relative to other Cyclone V variants to ensure adequate thermal management solutions are implemented on the target board.

Part Context

This FPGA belongs to the Cyclone V E family, designed for cost-sensitive applications requiring moderate to high performance. It shares architectural features with other devices in the series but offers distinct logic and memory capacities. The U19 designation typically indicates a specific pin count and package configuration within the broader product lineup.

Replacement Considerations

Direct substitutes include other Cyclone V E devices with similar logic counts and package types, such as the 5CEFA7F27I7, provided pin compatibility and memory requirements align with the design constraints.