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The Nexperia 74HC00PW-Q100,118 is a quad 2-input NAND gate qualified to AEC-Q100 Grade 1 for automotive use. It operates on a supply voltage of 2.0 V to 6.0 V with CMOS low power dissipation and high noise immunity. The device features latch-up performance exceeding 100 mA per JESD 78 Class II Level B. ESD protection exceeds 2000 V (HBM) and 1000 V (CDM). It complies with JEDEC standards JESD8C and JESD7A. Operating temperatures range from -40 °C to +85 °C and up to +125 °C. Inputs include clamp diodes for interfacing voltages exceeding VCC.
Verify the specific ordering suffix matches the required package type and temperature grade. Confirm that the application environment stays within the specified absolute maximum ratings to prevent permanent damage. Ensure design safeguards are implemented to manage ESD risks and latch-up conditions according to the provided JEDEC standards.
Select this component when automotive reliability under AEC-Q100 Grade 1 is mandatory. Choose this part for designs requiring operation across wide supply voltages from 2.0 V to 6.0 V. Consider this device for environments demanding high noise immunity and robust latch-up protection exceeding standard industrial levels.
This component belongs to the Nexperia 74HC00-Q100 series of quad 2-input NAND gates. It shares functional characteristics with other variants like the 74HC00D-Q100 but differs in physical packaging. The PW suffix indicates a TSSOP14 plastic thin shrink small outline package suitable for surface mount technology.
74HC00D-Q100,118
The 74HC00-Q100 utilizes CMOS input levels.
Inputs include clamp diodes, enabling the use of current limiting resistors to interface inputs to voltages in excess of VCC.