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The Nexperia 74HC03PW-Q100J is a quad 2-input NAND gate with open-drain outputs, qualified to AEC-Q100 Grade 1. It operates within a supply voltage range of 2.0 V to 6.0 V and supports ambient temperatures from -40 °C to +125 °C. The device features CMOS low power dissipation, high noise immunity, and latch-up performance exceeding 100 mA per JESD 78 Class II Level B. Inputs include clamp diodes for interfacing with voltages exceeding VCC. ESD protection exceeds 2000 V (HBM) and 1000 V (CDM). Propagation delay ranges from 19 ns to 29 ns at 4.5 V.
Verify the specific ordering suffix against the manufacturer's current documentation to ensure package and tape/reel specifications match design requirements. Confirm that the AEC-Q100 Grade 1 qualification status remains active for the requested quantity. Cross-reference the full part number with official Nexperia databases to validate availability and compliance with RoHS directives before finalizing procurement orders.
Select this component when an open-drain NAND function is required for automotive-grade designs. Ensure the application voltage does not exceed the 6.0 V maximum rating. Verify that the load capacitance and transition rates remain within the dynamic characteristics limits specified in the datasheet. Consider the TSSOP14 package dimensions for PCB layout constraints.
This component belongs to the Nexperia 74HC_HCT03_Q100 series, which includes both HC and HCT variants. The PW suffix indicates a TSSOP14 plastic thin shrink small outline package (SOT402-1). The Q100 designation confirms automotive qualification. This series provides standard quad 2-input NAND functionality with open-drain outputs, distinct from push-pull output variants.
The 74HC03PW,118 is a non-automotive equivalent. For direct automotive replacements, verify cross-references with other manufacturers offering AEC-Q100 qualified quad NAND gates in TSSOP14 packages.