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The Nexperia 74HC2G00DP-Q100H is a dual 2-input NAND gate designed for automotive applications, qualified to AEC-Q100 Grade 1 standards. It operates within a supply voltage range of 2.0 V to 6.0 V and supports ambient temperatures from -40 °C to +125 °C. The device features CMOS input levels, symmetrical output impedance, and high noise immunity. Propagation delays are specified at 95 ns maximum at 2.0 V and 22 ns maximum at 4.5 V. It includes ESD protection exceeding 2000 V (HBM) and 1000 V (CDM), with latch-up performance exceeding 100 mA per JESD 78 Class II Level B.
Verify the specific suffix 'Q100H' matches the required automotive grade and tape-and-reel packaging configuration. Confirm that the TSSOP8 package variant aligns with PCB footprint requirements. Ensure design specifications account for the recommended operating conditions regarding supply voltage and ambient temperature limits defined in the datasheet.
Select this component when automotive reliability under AEC-Q100 Grade 1 is mandatory. Choose this part over standard logic if operation below 4.5 V or above 5.5 V is required, as it supports a wider voltage range up to 6.0 V. Consider the TSSOP8 package dimensions for space-constrained designs requiring surface-mount assembly.
This device belongs to the Nexperia 74HC2G00-Q100 family of dual 2-input NAND gates. It shares functional characteristics with the 74HCT2G00-Q100 but utilizes CMOS input levels instead of TTL levels. The DP suffix indicates the TSSOP8 plastic thin shrink small outline package, while the Q100 designation confirms its automotive qualification status.
The 74HCT2G00DP-Q100H serves as a compatible alternative if TTL-compatible input switching levels are preferred over CMOS levels. Both devices share identical pinouts, package types, and automotive qualifications.