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The BSR57,215 is an N-channel Junction Field-Effect Transistor (JFET) manufactured by NXP Semiconductors. It is housed in a SOT23 surface-mount package with three terminals. The device operates in depletion mode and features a maximum drain-source breakdown voltage of 40 V. It supports a maximum continuous drain current of 0.02 A and has a maximum drain-source on-resistance of 25 Ω. The component is rated for a power dissipation of 0.25 W and can function at temperatures up to 150 °C. It exhibits a maximum feedback capacitance of 5 pF and complies with RoHS standards.
Verify the specific ordering code BSR57,215 against official NXP documentation to confirm package type and tape-and-reel specifications. Ensure compatibility with SOT23 footprint requirements during PCB layout. Check for lead-free compliance markings consistent with RoHS directives. Confirm availability through authorized NXP distribution channels to guarantee authenticity and traceability.
Select this component when an N-channel JFET with low gate leakage and high input impedance is required in a small form factor. The 40 V breakdown voltage suits low-voltage analog signal paths. Consider the 25 Ω on-resistance for linear application constraints. Verify that the 0.02 A current limit meets the circuit's operational demands without exceeding thermal limits in the intended enclosure.
The BSR57 belongs to NXP’s portfolio of discrete junction field-effect transistors. These components are engineered for analog signal processing tasks where high input impedance and low noise characteristics are critical. The BSR57 variant specifically targets applications requiring compact surface-mount solutions with reliable performance in consumer and industrial electronic devices.
Consult NXP datasheets for direct pin-compatible alternatives within the BSR series. Verify electrical parameters such as breakdown voltage and on-resistance match the original design requirements before substituting. Cross-reference with other manufacturers' JFETs only if full parameter equivalence is confirmed.