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The BUK7604-40A is an N-channel TrenchMOS standard level FET designed for automotive critical applications. It features a drain-source voltage of 40 V and a continuous drain current of 75 A at a mounting base temperature of 100 °C. The device exhibits a maximum on-state resistance of 8.5 mΩ at 175 °C junction temperature. Total power dissipation reaches 300 W at 25 °C mounting base temperature, with a non-repetitive avalanche energy rating of 1.6 J.
Verify the specific ordering suffix against official Nexperia documentation to confirm package type and reel specifications. Confirm that the component status remains active for new designs by checking the latest product data sheet revision history. Ensure compatibility with the SOT404 (D2PAK) footprint dimensions during PCB layout validation.
Select this component when designing circuits requiring robust performance under high thermal stress up to 175 °C. The 40 V rating suits 12 V automotive systems, while the 75 A continuous current capability supports heavy load applications. Verify that the gate drive voltage aligns with the standard level requirements for optimal RDS(on) performance.
This part belongs to the Nexperia BUK76 series of N-channel enhancement mode Field-Effect Transistors. Manufactured using TrenchMOS technology, it is housed in the SOT404 plastic surface-mounted package. The series is specifically engineered to meet automotive quality standards, ensuring durability in critical electronic systems.
Consult the official Nexperia datasheet for direct substitute part numbers within the same family or equivalent electrical specifications. Verify pinout compatibility and thermal characteristics before integrating any alternative components into existing designs.
The maximum junction temperature is 175 °C, allowing operation in thermally demanding environments.
Yes, the product has been designed and qualified to the AEC-Q101 standard for use in automotive critical applications.
The non-repetitive drain-source avalanche energy rating is 1.6 J under specified test conditions.