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The BUK9907-55ATE is an N-channel TrenchPLUS logic level Field-Effect Transistor (FET) utilizing TrenchMOS technology. Designed for automotive critical applications, it features integrated ElectroStatic Discharge (ESD) protection diodes and a temperature sensor. The device operates with a drain-source voltage of 55 V and supports continuous drain currents up to 140 A at 25 °C mounting base temperature. It exhibits low on-state resistance, typically 6.2 mΩ at VGS = 10V and ID = 50A. The component is housed in a TO-220 plastic single-ended package (SOT263B) with five leads.
Verify the current product status as the original NXP Standard Product business transitioned to Nexperia. Confirm that datasheet references to NXP or Philips Semiconductors are updated to Nexperia. Ensure compliance with the specific AEC-Q101 qualification requirements relevant to your application environment before finalizing procurement decisions.
Select this component for designs requiring high current handling in automotive environments. Consider the TO-220 package constraints for thermal management, as power dissipation is limited by the mounting base temperature. Verify that the logic level gate drive meets the control circuit requirements for optimal on-state resistance performance.
This part belongs to the N-channel enhancement mode FET family using TrenchMOS technology. It is specifically engineered for automotive reliability, meeting AEC standards. The integration of ESD protection and temperature sensing distinguishes it from standard discrete MOSFETs, offering enhanced functionality within a single package for complex power management systems.
Consult official Nexperia documentation for direct substitutes. Verify pinout compatibility and thermal characteristics when considering alternative packages. Ensure any replacement maintains the required AEC-Q101 qualification and electrical specifications for automotive safety applications.