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The CP398X-CPDM303NH is a silicon N-Channel MOSFET die designed for high-speed pulsed amplifier and driver applications. It features a drain-source voltage of 30 V, gate-source voltage of 12 V, continuous drain current of 3.6 A, and maximum pulsed drain current of 14.4 A. The device operates within a junction temperature range of -55 to +150 °C. Electrical characteristics include a typical on-resistance of 0.04 Ω at VGS=4.5V and ID=1.8A, with a total gate charge of 13 nC. The die dimensions are 37.8 x 26 MILS with a thickness of 5.5 MILS.
Verify the specific suffix required for your packaging needs. The 'WN' suffix denotes an unsawn wafer that is 100% tested with reject die inked. Ensure compatibility with bare die handling processes and confirm plating options if Tin/Lead or Lead-Free specifications are mandatory for your assembly line.
Select this component when designing circuits requiring a bare die N-Channel MOSFET with a 30 V rating and high-speed switching capabilities. Consider the physical dimensions of 37.8 x 26 MILS for layout constraints. Evaluate thermal management requirements given the operating junction temperature range up to +150 °C and the specific power dissipation limits inherent to bare die packages.
This part is a bare die semiconductor component manufactured by Central Semiconductor Corp. Unlike packaged transistors, it requires custom mounting and wire bonding during integration into final modules or hybrid circuits. It belongs to the company's portfolio of discrete silicon devices intended for specialized electronic designs.
No public confirmed substitute part numbers are available in the provided documentation. Verify pinout and electrical parameters against alternative suppliers before substitution.
The maximum pulsed drain current (tp=10μs) is 14.4 A.
The WN suffix indicates an unsawn wafer configuration where the full wafer is 100% tested with reject die inked.