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The CSD19536KTT is a surface-mount N-channel NexFET power MOSFET manufactured by Texas Instruments. It features a TO-263 (DDPAK-3) package with a maximum drain-source voltage of 100 V and a continuous drain current of 200 A at 25°C ambient temperature. The device exhibits a maximum on-resistance of 2.4 milliohms at 100 A and 10 V gate drive. Key electrical parameters include a maximum gate charge of 153 nC at 10 V, an input capacitance of 12000 pF at 50 V, and a gate-source threshold voltage of 3.2 V at 250 µA. It supports a maximum power dissipation of 375 W at case temperature and operates within a junction temperature range of -55°C to 175°C.
Verify the specific suffix 'KTT' corresponds to the tape-and-reel packaging format required for automated assembly processes. Confirm RoHS compliance status and moisture sensitivity level classification prior to soldering profile selection. Ensure ordering documentation matches the manufacturer's part number exactly to avoid substitution errors with similar NexFET variants.
Select this component when designing circuits requiring high current handling capabilities exceeding 100 A with minimal conduction loss. Evaluate thermal management requirements based on the 375 W case power dissipation rating and ensure adequate heatsinking or PCB copper area utilization. Consider the 153 nC gate charge for driver selection to achieve optimal switching speeds without excessive drive current demands.
This device belongs to the CSD19536 series of NexFET power MOSFETs from Texas Instruments. The series is engineered for high-performance power management solutions, offering a balance of low on-resistance and fast switching characteristics. The KTT suffix specifically denotes the surface-mount DDPAK-3 package configuration suitable for high-current applications.
Direct substitutes within the same family include CSD19536KCS, which offers identical electrical specifications but utilizes a through-hole TO-220-3 package instead of the surface-mount DDPAK-3 form factor. Verify pinout compatibility and thermal interface requirements when considering package changes.