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The DMNH6021SPSWQ-13 is a single N-channel enhancement mode MOSFET manufactured by Diodes Incorporated. It features a 60V drain-source breakdown voltage and operates within a junction temperature range of -55°C to +175°C. The device utilizes the PowerDI5060-8 package with wettable flank terminals. Electrical specifications include a maximum on-resistance of 23mΩ at VGS=10V and 28mΩ at VGS=4.5V, both measured at an ID of 12A. Continuous drain current ratings are 44A at TC=+25°C and 31A at TC=+100°C.
Verify that the specific part number suffix matches the required packaging configuration. Confirm compliance with RoHS directives and halogen-free requirements as defined by the manufacturer's quality definitions. Ensure the procurement channel is authorized to guarantee product authenticity and traceability for automotive-grade components.
Select this component when designing systems requiring robust thermal performance and high conversion efficiency. The low input capacitance and fast switching speed make it suitable for high-frequency power management applications. Verify that the gate drive voltage aligns with the specified thresholds for optimal on-resistance performance.
This component belongs to the DMNH series of N-channel MOSFETs from Diodes Incorporated. It is specifically engineered to meet stringent automotive industry requirements. The device integrates high-performance silicon technology within a compact surface-mount package designed for efficient heat dissipation and reliable long-term operation.
Consult official substitution lists or contact the manufacturer directly for verified alternative part numbers. Do not assume cross-compatibility based solely on similar electrical parameters without verifying package dimensions and qualification standards.
Yes, the device is qualified to AEC-Q101 standards and is supported by a PPAP, making it suitable for automotive applications.
The maximum operating junction temperature is +175°C.
Yes, the PowerDI5060-8 package includes wettable flank terminals to facilitate improved optical inspection.