SEARCH
— IC芯片 | 连接器 | 传感器 | 被动器件 —
The DMT35M4LFVW-13 is a 30V N-channel enhancement mode MOSFET manufactured by Diodes Incorporated. It utilizes the PowerDI3333-8 package and offers a maximum drain-source on-resistance of 6mΩ at VGS=10V and 9mΩ at VGS=4.5V. The device supports a continuous drain current of up to 60A at TC=25°C and features a gate threshold voltage range of 1.15V to 2.5V. Total gate charge is specified at 7.9nC for VGS=4.5V and 16.1nC for VGS=10V. Operating temperature ranges from -55°C to +150°C.
Verify the specific ordering suffix '-13' corresponds to the 3,000 units per tape and reel packaging configuration as defined in the manufacturer's ordering information. Confirm that the component meets RoHS 3 compliance standards and is halogen and antimony free. Ensure the procurement channel is authorized to guarantee product authenticity and traceability.
Select this component for applications requiring low on-state resistance and high current handling within a compact footprint. Consider the thermal characteristics and power dissipation limits when designing heat management solutions. Verify that the required gate drive voltage aligns with the specified RDS(ON) thresholds for optimal efficiency.
This part belongs to the DMTH series of N-channel enhancement mode MOSFETs from Diodes Incorporated. It is designed for high-efficiency power management applications where minimizing board space and reducing conduction losses are critical design priorities. The PowerDI3333-8 package provides a thermally efficient solution compared to traditional surface mount packages.
Consult the official datasheet or contact Diodes Incorporated directly for verified substitute part numbers. Do not assume cross-compatibility based solely on similar electrical ratings without confirming pinout and package dimensions.
The maximum continuous drain current is 60A at a case temperature of +25°C and 48A at a case temperature of +70°C.
Yes, the device undergoes 100% Unclamped Inductive Switching (UIS) testing in production to ensure reliability under such conditions.