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FDZ1827NZ is listed in the FET, MOSFET Arrays range at ChipApex. The manufacturer field lists Fairchild Semiconductor. Its product description is MOSFET 2N-CH 20V 10A 6WLCSP. Review the specifications below when checking this part for your BOM.
The FDZ1827NZ is a P-Channel Power MOSFET manufactured by Fairchild Semiconductor, belonging to the UniFET-II family. It features a drain-source voltage (Vdss) of -30 V and a continuous drain current (Id) of -14 A at case temperature. The device exhibits a maximum on-resistance (Rds(on)) of 15 mΩ at Vgs = -10 V and Id = -14 A. Gate charge (Qg) is typically 16 nC at Vgs = -10 V. It is housed in a TO-220F-3 package with a maximum power dissipation of 40 W at case temperature.
Verify the manufacturer part number against official Fairchild or ON Semiconductor datasheets to confirm specifications. Ensure the component matches the required TO-220F-3 package and electrical ratings for your specific circuit design before procurement.
Select this component for applications requiring a -30 V P-Channel MOSFET with low Rds(on). Verify that the thermal management solution supports the 40 W power dissipation rating at the intended case temperature. Confirm compatibility with standard logic-level or higher gate drive voltages.
This component is part of the UniFET-II series, designed for general-purpose power switching. It utilizes planar stripe DMOS technology to minimize on-resistance while maintaining high avalanche strength. The TO-220F-3 package facilitates through-hole mounting for effective heat dissipation in industrial and consumer electronics.
Cross-reference with other -30 V P-Channel MOSFETs in the TO-220F-3 package. Verify pinout compatibility and ensure equivalent or superior Rds(on), Qg, and avalanche energy ratings are met by any substitute part.
The typical gate charge is 16 nC when measured at a gate-source voltage of -10 V.
Yes, devices in this UniFET-II family are typically 100% avalanche tested to ensure robustness.
The maximum power dissipation is rated at 40 W when measured at the case temperature.
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