SEARCH
— IC芯片 | 连接器 | 传感器 | 被动器件 —
The MMBD1403ALT1G is a small signal switching diode manufactured by onsemi, housed in an SOT-23 package. It features a maximum repetitive reverse voltage of 200 V and an average rectified forward current of 200 mA. The device supports non-repetitive peak forward surge currents up to 2.0 A. Electrical characteristics include a maximum reverse recovery time of 50 ns and a total capacitance of 2.0 pF at 1.0 MHz. Operating junction temperatures range up to 150 °C with power dissipation rated at 350 mW.
Verify the specific ordering suffix 'ALT1G' corresponds to the required tape and reel packaging quantity of 3000 units. Confirm that the component meets RoHS compliance standards as indicated in the datasheet. Ensure the SOT-23 footprint matches the design layout requirements before finalizing procurement specifications.
Select this component when a dual diode configuration is required in a minimal footprint. The 200 V rating provides sufficient margin for many low-voltage logic and signal processing interfaces. Consider the thermal resistance and power dissipation limits if operating near maximum current ratings or elevated ambient temperatures.
This part belongs to the MMBD140x series of small signal diodes from onsemi. The series includes variants such as MMBD1401, MMBD1404, and MMBD1405, which share similar electrical characteristics but differ in internal connection configurations. These devices are designed for high-speed switching applications requiring low capacitance and fast recovery times.
Direct replacements within the same family include MMBD1401, MMBD1404, and MMBD1405. Verify pinout compatibility as these variants may have different internal anode/cathode arrangements. Cross-reference with other manufacturers' SOT-23 dual diodes only if electrical parameters match exactly.
The maximum repetitive reverse voltage (VRRM) is 200 V.
It contains two diodes configured in a dual arrangement within a single SOT-23 package.
The maximum reverse recovery time (trr) is 50 ns under specified test conditions.