SCANSTA101SM/NOPB

Specialized Overview

The SCANSTA101SM/NOPB is a specialized interface integrated circuit manufactured by Texas Instruments, designed for low-voltage IEEE 1149.1 system test access applications. It supports Boundary Scan protocols to facilitate digital interconnect testing. The device operates at a fixed supply voltage of 3.3 V, with a maximum operating temperature of +85°C and a minimum of -40°C. It draws a typical operating supply current of 250 uA. The component is housed in an nFBGA-49 package suitable for surface mount technology (SMD/SMT). It is classified under Interface ICs and is part of the SCANSTA101 series.

Specialized Feature Summary

• Supports IEEE 1149.1 Boundary Scan protocol for system-level testing
• Designed for low-voltage operation at 3.3 V
• Optimized for low power consumption with minimal supply current

Specialized Applications

• Digital interconnect testing in complex electronic systems
• Boundary scan compliance verification
• System-level fault isolation and diagnostics

Specialized Procurement Notes

Verify the complete part number including suffixes such as NOPB to ensure correct RoHS compliance and packaging configuration. Confirm that the nFBGA-49 package matches the PCB footprint requirements. Check moisture sensitivity levels and reflow soldering profiles prior to assembly. Ensure the design supports the required 3.3 V supply rail and thermal management for the specified operating temperature range.

Specialized Selection Notes

Select this component when a dedicated solution for IEEE 1149.1 boundary scan access is required in a low-voltage environment. Consider the nFBGA-49 package constraints and pinout compatibility during schematic capture. Evaluate the 250 uA supply current against system power budgets. Verify that the -40°C to +85°C industrial temperature range meets the operational environmental conditions of the target application.

Specialized Part Context

The SCANSTA101 belongs to the SCANSTA family of specialized interface devices from Texas Instruments. These components are engineered specifically for test access port (TAP) controller implementations within larger system architectures. Unlike general-purpose logic, this part focuses exclusively on facilitating standardized boundary scan operations for manufacturing test and field diagnostics.

Specialized Replacement Considerations

Consult official Texas Instruments documentation for verified cross-reference part numbers. Ensure any substitute maintains IEEE 1149.1 compatibility and identical package dimensions.