SN74LVT18512DGGR

SN74LVT18512DGGR

  • Description:IC SCAN TEST UNIV TXRX 64TSSOP
  • Series:74LVT
  • Mfr:Texas Instruments
  • Package:Tape & Reel (TR),Cut Tape (CT)

SKU:3ee0611e48c0 Category: Brand:

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Product Detailed Parameters

  • Description:IC SCAN TEST UNIV TXRX 64TSSOP
  • Series:74LVT
  • Mfr:Texas Instruments
  • Package:Tape & Reel (TR),Cut Tape (CT)
  • Logic Type:Scan Test Universal Bus Transceiver
  • Number of Circuits:18-Bit
  • Current - Output High, Low:32mA, 64mA
  • Voltage - Supply:2.7V ~ 3.6V
  • Operating Temperature:-40°C ~ 85°C
  • Mounting Type:Surface Mount
  • Package / Case:64-TFSOP (0.240", 6.10mm Width)
  • Supplier Device Package:64-TSSOP

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SN74LVT18512DGGR

Overview

The SN74LVT18512DGGR is a 3.3-V ABT scan test device featuring an 18-bit universal bus transceiver. It utilizes a TSSOP-64 package with a 6.1mm body width. The component supports bidirectional data transfer for high-speed digital applications. It integrates dedicated control inputs to manage data flow direction and enable states within the transceiver architecture.

Feature Summary

  • Integrates an 18-bit universal bus transceiver for comprehensive data path management
  • Supports 3.3-V ABT logic family standards for compatible system integration
  • Includes scan test functionality to facilitate manufacturing verification

Applications

  • Scan test structures in digital logic verification
  • Universal bus interface implementations requiring 18-bit width
  • System-level testing architectures utilizing ABT technology

Procurement Notes

Verify the specific suffix DGGR corresponds to the TSSOP-64 package variant when sourcing. Confirm that the 3.3-V ABT specification aligns with the target system voltage requirements. Ensure the 18-bit configuration matches the design's data width needs. Check for RoHS compliance documentation if required by regulatory standards.

Selection Notes

Select this component when an 18-bit wide bus transceiver is required within a 3.3-V logic environment. The ABT technology offers improved performance over standard CMOS families. Consider the TSSOP-64 package constraints regarding board space and thermal dissipation. Verify that the scan test features are necessary for the production testing strategy.

Part Context

This part belongs to Texas Instruments' specialty function logic category, specifically designed for scan test applications. It is part of the broader ABT (Advanced BiCMOS Technology) family, which provides enhanced speed and drive capabilities compared to older logic families. The device serves as a bridge between internal chip logic and external bus systems.

Replacement Considerations

Consult official substitution guides for equivalent 18-bit universal bus transceivers. Verify pin compatibility and electrical characteristics before replacing. Ensure the replacement maintains the 3.3-V ABT performance profile.

SN74LVT18512DGGRSN74LVT18512DGGR

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