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The onsemi 2N5770_D26Z is an NPN RF transistor housed in a TO-92 package. It features a collector-emitter voltage (VCEO) of 15 V, a collector-base voltage (VCBO) of 30 V, and an emitter-base voltage (VEBO) of 4.5 V. The device supports a continuous collector current of 50 mA with a total power dissipation of 350 mW at 25°C. Operating temperatures range from -55°C to +150°C. Electrical characteristics include a DC current gain (hFE) of 20 to 200 at IC = 3.0 mA, and a small-signal current gain (hfe) of 9.0 to 18 at 100 MHz. Thermal resistance is 125 °C/W junction-to-case and 357 °C/W junction-to-ambient.
Verify the manufacturer origin carefully, as this part number was originally produced by Fairchild Semiconductor before its acquisition by onsemi. Confirm that the D26Z suffix corresponds to the specific tape and reel packaging configuration required for your automated assembly process. Ensure the component meets all necessary environmental compliance standards for your target market.
Select this component when an NPN silicon planar epitaxial transistor is required for low-power RF applications operating up to several hundred megahertz. Consider the 15 V collector-emitter breakdown limit and 50 mA maximum continuous current constraints during circuit design. Evaluate the thermal resistance values if the application involves sustained operation near the upper temperature limits.
This component belongs to the 2N5770 series of discrete NPN RF transistors. Originally manufactured by Fairchild Semiconductor, production rights were transferred to onsemi following corporate acquisitions. The device utilizes a silicon planar epitaxial process and is packaged in the standard TO-92 form factor, maintaining historical specifications for legacy RF circuit replacements.
The datasheet specifies functional test parameters up to 500 MHz, including power output and collector efficiency measurements at that frequency.
The D26Z suffix indicates the specific tape and reel packaging style and quantity (2,000 units per reel). It does not alter the electrical characteristics or internal structure of the transistor.
The noise figure is specified as 6.0 dB under test conditions of IC = 1.0 mA, VCE = 8.0 V, and f = 60 MHz.