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The Nexperia 2N7002AK-Q is an N-channel enhancement mode Field-Effect Transistor utilizing Trench MOSFET technology. It operates within a 60 V drain-source voltage range and supports a continuous drain current of 240 mA at 25 °C. The device features a maximum on-state resistance of 3 Ω at VGS = 10 V and 100 mA. It is housed in a compact SOT23 surface-mounted package with three terminals. The component is qualified to AEC-Q101 standards and supports an extended junction temperature range up to 175 °C.
Verify the specific ordering suffix matches the required automotive grade specification. Confirm that the SOT23 package dimensions align with the target PCB footprint. Ensure the design accounts for the 175 °C maximum junction temperature rating during thermal analysis. Check for any regional export control requirements applicable to this semiconductor component.
Select this component when automotive-grade reliability and high-temperature operation are required. The low gate charge and fast switching characteristics make it suitable for high-frequency applications. Consider the 60 V breakdown voltage and 240 mA current limits to ensure adequate headroom for the intended load conditions.
This part belongs to the 2N7002 series of N-channel MOSFETs manufactured by Nexperia. It represents the automotive-qualified variant designed for robust performance in demanding environments. The device leverages Trench MOSFET technology to achieve low on-resistance within a small plastic surface-mount package.
Direct pin-compatible replacements include the standard commercial grade 2N7002,215 or other manufacturers' equivalents such as BSS138 variants. Verify that substitute components meet the AEC-Q101 qualification if automotive usage is mandated. Compare thermal resistance values to ensure equivalent heat dissipation capabilities.
The maximum operating junction temperature is 175 °C.
Yes, the device is qualified in accordance with the AEC-Q101 standard for discrete semiconductors.
The typical total gate charge is 0.21 nC under standard test conditions.