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2SA1931,NIKKIQ(J is listed in the Single Bipolar Transistors range at ChipApex. The manufacturer field lists Toshiba Semiconductor and Storage. Its product description is TRANS PNP 50V 5A TO-220NIS. Review the specifications below when checking this part for your BOM.
The Toshiba Semiconductor and Storage 2SA1931 is a silicon PNP epitaxial planar transistor designed for high-current switching applications. It features a collector-emitter breakdown voltage of 50 V, a maximum collector current of 5 A, and a transition frequency of 60 MHz. The device operates with a low saturation voltage of -0.4 V (max) at Ic = -2 A and Ib = -0.2 A. It utilizes the PCT process and is housed in a TO-220NIS package.
Verify component authenticity through authorized distributors or direct manufacturer channels. Confirm RoHS compliance status via official documentation as requirements vary by production lot. Ensure proper thermal management design to maintain junction temperature within specified limits during operation.
Select this component for designs requiring robust PNP switching performance with moderate speed. Verify that the required collector current does not exceed 5 A and that the operating voltage remains below 50 V. Consider thermal derating guidelines when designing heat dissipation solutions for continuous operation.
This part belongs to Toshiba's general-purpose bipolar junction transistor lineup utilizing epitaxial planar technology. It serves as a standard discrete semiconductor solution for industrial and consumer electronics where reliable high-current switching is necessary without specialized RF characteristics.
The datasheet explicitly identifies the 2SC4881 as its complementary counterpart. No other direct substitute part numbers are documented in the provided source material.
The absolute maximum collector-base voltage (VCBO) is rated at -60 V.
No, it is a bipolar junction transistor requiring base current drive, not a MOSFET suitable for direct logic-level voltage control.
The typical turn-on time (ton) is specified as 0.1 μs under standard test conditions.
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