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The 2SK2866(F) is a silicon N-channel MOS field-effect transistor manufactured by Toshiba Semiconductor and Storage. It utilizes π-MOSV technology for high-speed switching applications. The device features a drain-source voltage rating of 600 V and a continuous DC drain current capacity of 10 A at 25°C case temperature. Key electrical characteristics include a typical drain-source on-resistance of 0.54 Ω and a forward transfer admittance of 9.0 S. It supports repetitive avalanche energy ratings up to 12.5 mJ and operates with a maximum channel temperature of 150°C.
Verify the specific ordering suffix against official Toshiba documentation to confirm environmental compliance status, such as RoHS compatibility. Confirm package type JEDEC TO-220AB matches design requirements. Review absolute maximum ratings carefully to ensure thermal management meets the specified channel-to-case resistance limits during operation.
Select this component for designs requiring high-voltage N-channel switching with low conduction losses. Ensure gate drive circuits accommodate the threshold voltage range of 2.0 to 4.0 V. Verify that the application circuit respects the 600 V breakdown limits and manages thermal dissipation within the 125 W power rating constraints.
This part belongs to Toshiba's silicon N-channel MOSFET series designed for general electronics and industrial applications. It is distinct from bipolar transistors or diodes in its voltage-controlled operation. The device is intended for use in power conversion systems where fast switching speeds and robust avalanche capability are required.
Consult Toshiba Semiconductor for verified substitute part numbers. Do not assume cross-compatibility with other manufacturers' devices without verifying pinout, thermal resistance, and electrical parameter alignment.
The device supports a repetitive avalanche energy (EAR) rating of 12.5 mJ.
The gate threshold voltage (Vth) ranges from 2.0 V to 4.0 V under standard test conditions.